Moylan, James

Est 1885 - Est 1938  (53 years)  

Loading...

 Set As Default Person

 Restore Site Default Person

Byford, Lilian Mary Ann

1887 - 1978

Birth	25 Dec 1887	Kensington, London, , England
Died	Between Jan and Mar 1978	District Greenwich
Father	Byford, Charles William           b. Between Jan and Mar 1863, Kilburn, , Middlesex, England
Mother	Maw, Harriet Trender           b. Between Jul and Sep 1862, Chelsea, , Middlesex, England
Married	Between Jul and Sep 1882	District Kensington
Family 1	Moylan, James           b. Est 1885
Married	Between Oct and Dec 1913	District Hampstead
Family 2	Aaron, Robert Anthony           b. 13 Apr 1898
Married	Jul-Sep 1941	District Woolwich

Aaron, Robert Anthony

1898 - 1973  (74 years)

Birth	13 Apr 1898
Died	Jan-Mar 1973	District Greenwich
Family	Byford, Lilian Mary Ann           b. 25 Dec 1887, Kensington, London, , England
Married	Jul-Sep 1941	District Woolwich

• Relationship	with Living
  Birth	Est 1885
  Gender	Male
  _UID	49BF12B46BCB4330A8E2A99A0DBE76EA6F96
  Death	Est 1938
  Origins
  Headstones	Submit Headstone Photo
  Person ID	I56237	The Family Maw
  Last Modified	21 Jul 2021

  
  

  Family	Byford, Lilian Mary Ann           b. 25 Dec 1887, Kensington, London, , England           d. Between Jan and Mar 1978, District Greenwich   Other Partners: Aaron, Robert Anthony  m. Jul-Sep 1941
  Marriage	Between Oct and Dec 1913	District Hampstead   [1]
  Family ID	F18863	Group Sheet  |  Family Chart
  Last Modified	21 Jul 2021

  
  

• Event Map	Click to display
  		Marriage - Between Oct and Dec 1913 - District Hampstead   = Link to Google Earth
  Pin Legend

  
  

• Sources

  [S118] England and Wales, Civil Registration Index: 1837-1983, (FreeBMD. England and Wales, Civil Registration Index: 1837-1983. [database online] Provo, UT: Ancestry.com, 2001. Original data: Microfilm and microfiche of the England and Wales, Civil Registration Indexes created by the General Register Office, in London, England.), GRO Reference - District Hampstead - Volume 1a Page 1443 (Reliability: 3).